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ECCV
2002
Springer
16 years 8 months ago
Multi-scale EM-ICP: A Fast and Robust Approach for Surface Registration
We investigate in this article the rigid registration of large sets of points, generally sampled from surfaces. We formulate this problem as a general Maximum-Likelihood (ML) estim...
Sébastien Granger, Xavier Pennec
ICSE
2008
IEEE-ACM
16 years 7 months ago
Are fit tables really talking?: a series of experiments to understand whether fit tables are useful during evolution tasks
Test-driven software development tackles the problem of operationally defining the features to be implemented by means of test cases. This approach was recently ported to the earl...
Filippo Ricca, Massimiliano Di Penta, Marco Torchi...
SEW
2007
IEEE
16 years 28 days ago
Testing Patterns
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
Neelam Soundarajan, Jason O. Hallstrom, Adem Delib...
FOCS
2005
IEEE
16 years 8 days ago
A Characterization of the (natural) Graph Properties Testable with One-Sided Error
The problem of characterizing all the testable graph properties is considered by many to be the most important open problem in the area of property-testing. Our main result in thi...
Noga Alon, Asaf Shapira
SPAA
2004
ACM
16 years 2 days ago
The effect of faults on network expansion
We study the problem of how resilient networks are to node faults. Specifically, we investigate the question of how many faults a network can sustain and still contain a large (i...
Amitabha Bagchi, Ankur Bhargava, Amitabh Chaudhary...