We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
We study the worst case complexity of regular operations on cofinite languages (i.e., languages whose complement is finite) and provide algorithms to compute efficiently the result...
An algorithm for computing the maximum area empty isothetic orthoconvex polygon among a set of n points in a rectangular region, is presented. The worst case time and space comple...
Subhas C. Nandy, Krishnendu Mukhopadhyaya, Bhargab...
This paper addresses a constrained two-terminal reliability measure referred to as Distance Reliability (DR) between the source node u and the destination node I with the shortest...
We present a process algebraic approach for extending to the probabilistic setting the classical logical information flow analysis of computer systems. In particular, we employ a ...