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DFT
2004
IEEE
92views VLSI» more  DFT 2004»
15 years 10 months ago
Reliability and Yield: A Joint Defect-Oriented Approach
We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
Roman Barsky, Israel A. Wagner
LATIN
2010
Springer
15 years 8 months ago
Complexity of Operations on Cofinite Languages
We study the worst case complexity of regular operations on cofinite languages (i.e., languages whose complement is finite) and provide algorithms to compute efficiently the result...
Frédérique Bassino, Laura Giambruno,...
CCCG
2008
15 years 8 months ago
Recognition of Largest Empty Orthoconvex Polygon in a Point Set
An algorithm for computing the maximum area empty isothetic orthoconvex polygon among a set of n points in a rectangular region, is presented. The worst case time and space comple...
Subhas C. Nandy, Krishnendu Mukhopadhyaya, Bhargab...
IPPS
2007
IEEE
16 years 1 months ago
A Combinatorial Analysis of Distance Reliability in Star Network
This paper addresses a constrained two-terminal reliability measure referred to as Distance Reliability (DR) between the source node u and the destination node I with the shortest...
Xiaolong Wu, Shahram Latifi, Yingtao Jiang
CONCUR
2001
Springer
15 years 11 months ago
Probabilistic Information Flow in a Process Algebra
We present a process algebraic approach for extending to the probabilistic setting the classical logical information flow analysis of computer systems. In particular, we employ a ...
Alessandro Aldini