2962 search results - page 286 / 593 » The Bunch-Active Shape Model |
140
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ICCD
2007
IEEE
16 years 3 months ago
2007
IEEE
As the VLSI technology marches beyond 65 and 45nm process technologies, variation in gate length has a direct impact on leakage and performance of CMOS transistors. Due to sub-wav...
139
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DFT
2007
IEEE
16 years 1 months ago
2007
IEEE
Decreasing feature sizes have led to an increased vulnerability of random logic to soft errors. A particle strike may cause a glitch or single event transient (SET) at the output ...
178
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TOG
2002
15 years 6 months ago
2002
We present a procedural approach to authoring layered, solid models. Using a simple scripting language, we define the internal structure of a volume from one or more input meshes....
160
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SIAMAM
2010
15 years 5 months ago
2010
We study vesicles formed by lipid bilayers that are governed by an elastic bending energy and on which the lipids laterally separate forming two different phases. The energy laden...
186
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CVPR
2008
IEEE
16 years 8 months ago
2008
IEEE
Parameterized Appearance Models (PAMs) (e.g. Eigentracking, Active Appearance Models, Morphable Models) are commonly used to model the appearance and shape variation of objects in...