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BMCBI
2004
90views more  BMCBI 2004»
15 years 6 months ago
Statistical monitoring of weak spots for improvement of normalization and ratio estimates in microarrays
Background: Several aspects of microarray data analysis are dependent on identification of genes expressed at or near the limits of detection. For example, regression-based normal...
Igor Dozmorov, Nicholas Knowlton, Yuhong Tang, Mic...
DAC
2002
ACM
16 years 7 months ago
Combined BEM/FEM substrate resistance modeling
For present-day micro-electronic designs, it is becoming ever more important to accurately model substrate coupling effects. Basically, either a Finite Element Method (FEM) or a B...
Eelco Schrik, N. P. van der Meijs
KDD
2002
ACM
147views Data Mining» more  KDD 2002»
16 years 7 months ago
Visualized Classification of Multiple Sample Types
The goal of the knowledge discovery and data mining is to extract the useful knowledge from the given data. Visualization enables us to find structures, features, patterns, and re...
Li Zhang, Aidong Zhang, Murali Ramanathan
DATE
2008
IEEE
112views Hardware» more  DATE 2008»
16 years 1 months ago
An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
Paolo Bernardi, Matteo Sonza Reorda
CVPR
2007
IEEE
16 years 1 months ago
Estimating Cluster Overlap on Manifolds and its Application to Neuropsychiatric Disorders
Although it is usually assumed in many pattern recognition problems that different patterns are distinguishable, some patterns may have inseparable overlap. For example, some faci...
Peng Wang, Christian Köhler, Ragini Verma