2006 search results - page 142 / 402 » Testing with Respect to Concerns |
140
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DATE
2008
IEEE
16 years 26 days ago
2008
IEEE
There have been serious concerns recently about the security of microchips from hardware trojan horse insertion during manufacturing. This issue has been raised recently due to ou...
128
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DATE
2007
IEEE
16 years 22 days ago
2007
IEEE
An important aspect of Design for Yield for embedded SRAM is identifying the expected worst case behavior in order to guarantee that sufficient design margin is present. Previousl...
259
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ICRA
2007
IEEE
16 years 21 days ago
2007
IEEE
— Efficient, reliable and flexible handling is still very challenging in micromanipulation and micro-assembly. In this paper, we propose an original thermally actuated gripper b...
213
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ACSC
2005
IEEE
16 years 1 days ago
2005
IEEE
This paper discusses the effect of context on mobile usability, proposes an expanded model of mobile application context, and conducts an empirical study to test a number of hypot...
161
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AVBPA
2005
Springer
15 years 12 months ago
2005
Springer
This paper concerns the generalizability of biometric identification results from small-sized closed systems to larger open systems. Many researchers have claimed high identificati...