6800 search results - page 862 / 1360 » Testing with Functions as Specifications |
179
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COMPIMAGE
2010
Springer
16 years 1 days ago
2010
Springer
We study how the quality of an image reconstructed by a binary tomographic algorithm depends on the direction of the observed object in the scanner, if only a few projections are a...
149
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DATE
2002
IEEE
15 years 12 months ago
2002
IEEE
Accurate gate-level static timing analysis in the presence of RC loads has become an important problem for modern deep-submicron designs. Non-capacitive loads are usually analyzed...
184
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ISSRE
2002
IEEE
15 years 12 months ago
2002
IEEE
In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a furt...
170
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ISWC
2002
IEEE
15 years 12 months ago
2002
IEEE
This paper presents the e-SUIT, a wearable computer incorporated in a traditional business suit. A key feature of the system is an array of input/output devices integrated into th...
183
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ICAISC
2010
Springer
15 years 11 months ago
2010
Springer
In the paper a new evolutionary algorithm for induction of univariate regression trees is proposed. In contrast to typical top-down approaches it globally searches for the best tre...