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TCAD
2002
134views more  TCAD 2002»
15 years 7 months ago
DS-LFSR: a BIST TPG for low switching activity
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
Seongmoon Wang, Sandeep K. Gupta
MR
2008
88views Robotics» more  MR 2008»
15 years 7 months ago
Characterization of semiconductor interfaces using a modified mixed mode bending apparatus
This research deals with the experimental assessment of the strength of bi-material interfaces as a function of mode mixity, focusing on two dimensional problems. A modified mixed...
J. Thijsse, Olaf van der Sluis, J. A. W. van Domme...
SAC
2008
ACM
15 years 7 months ago
Automatic software fault localization using generic program invariants
Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of lowcost, ge...
Rui Abreu, Alberto González 0002, Peter Zoe...
TWC
2010
15 years 2 months ago
Frame detection and timing acquisition for OFDM transmissions with unknown interference
Abstract--Frame detection and timing acquisition are challenging tasks in orthogonal frequency-division multiplexing systems plagued by narrowband interference (NBI). Most existing...
Luca Sanguinetti, Michele Morelli, H. Vincent Poor
MICCAI
2004
Springer
16 years 8 months ago
Bias in Resampling-Based Thresholding of Statistical Maps in fMRI
Selecting a threshold for the statistical parameter maps in functional MRI (fMRI) is a delicate matter. The use of advanced test statistics and/or the complex dependence structure ...
Ola Friman, Carl-Fredrik Westin