A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
This research deals with the experimental assessment of the strength of bi-material interfaces as a function of mode mixity, focusing on two dimensional problems. A modified mixed...
J. Thijsse, Olaf van der Sluis, J. A. W. van Domme...
Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of lowcost, ge...
Abstract--Frame detection and timing acquisition are challenging tasks in orthogonal frequency-division multiplexing systems plagued by narrowband interference (NBI). Most existing...
Luca Sanguinetti, Michele Morelli, H. Vincent Poor
Selecting a threshold for the statistical parameter maps in functional MRI (fMRI) is a delicate matter. The use of advanced test statistics and/or the complex dependence structure ...