6800 search results - page 536 / 1360 » Testing with Functions as Specifications |
180
click to vote
VTS
2003
IEEE
16 years 26 days ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional open and bridge fault models are incomplete because only the functional fault or a subset of delay fault are...
209
click to vote
TSD
2001
Springer
16 years 14 hour ago
2001
Springer
The Internet offers remote access to many information systems to users independent of time and location. This paper describes an agent based approach to deal with issues that rise ...
166
click to vote
ICCAD
2000
IEEE
16 years 57 min ago
2000
IEEE
The Charge Sharing (CS) problem is one of notorious noise problems in domino circuits design and test. In this paper, this problem is thoroughly investigated by considering circui...
178
click to vote
VTS
2000
IEEE
15 years 12 months ago
2000
IEEE
This paper focuses on observability, one of the open issues in High-Level test generation. Three different approximate metrics for taking observability into account during RT-leve...
156
click to vote
GLVLSI
1999
IEEE
15 years 12 months ago
1999
IEEE
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...