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174
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
203
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ATS
2010
IEEE
15 years 4 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
174
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EOR
2007
15 years 6 months ago
2007
The motivation of this paper is to obtain an analytical closed form of a quadratic objective function arising from a stochastic decision process with bivariate exponential probabi...
175
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SIGSOFT
2006
ACM
16 years 7 months ago
2006
ACM
Testing and code editing are interleaved activities during program development. When tests fail unexpectedly, the changes that caused the failure(s) are not always easy to find. W...
183
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CEC
2009
IEEE
15 years 11 months ago
2009
IEEE
Abstract— We propose an asynchronous island-model algorithm distribution framework and test the popular Differential Evolution algorithm performance when a few processors are ava...