2686 search results - page 336 / 538 » Testing metric properties |
211
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TIFS
2008
15 years 6 months ago
2008
We consider the problem of secret key distribution in a sensor network with multiple scattered sensor nodes and a mobile device that can be used to bootstrap the network. Our main...
176
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TIFS
2008
15 years 6 months ago
2008
We investigate three schemes for severe compression of iris images in order to assess what their impact would be on recognition performance of the algorithms deployed today for ide...
177
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BMCBI
2004
15 years 6 months ago
2004
Background: Clustering is one of the most commonly used methods for discovering hidden structure in microarray gene expression data. Most current methods for clustering samples ar...
181
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TVLSI
1998
15 years 6 months ago
1998
— Excessive instantaneous power consumption may reduce the reliability and performance of VLSI chips. Hence, to synthesize circuits with high reliability, it is imperative to efï...
151
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TVLSI
1998
15 years 6 months ago
1998
— Fault-tolerance is an important system metric for many operating environments, from automotive to space exploration. The conventional technique for improving system reliability...