2686 search results - page 325 / 538 » Testing metric properties |
165
click to vote
DATE
2006
IEEE
16 years 17 days ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...
152
click to vote
IAT
2006
IEEE
16 years 17 days ago
2006
IEEE
We present a universal mechanism that can be combined with existing trust models to extend their capabilities towards efficient modelling of the situational (contextdependent) tr...
155
click to vote
ISESE
2006
IEEE
16 years 16 days ago
2006
IEEE
Over the last decades, a considerable amount of empirical knowledge about the efficiency of defect-detection techniques has been accumulated. Also a few surveys have summarised th...
172
click to vote
ACMSE
2006
ACM
16 years 14 days ago
2006
ACM
We propose an efficient and novel approach for discovering communities in real-world random networks. Communities are formed by subsets of nodes in a graph, which are closely rela...
132
click to vote
ISSTA
2006
ACM
16 years 14 days ago
2006
ACM
One of the main cost factors in software development is the detection and removal of defects. However, the relationships and influencing factors of the costs and revenues of defe...