2686 search results - page 313 / 538 » Testing metric properties |
172
click to vote
DAC
2007
ACM
16 years 7 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
160
click to vote
CHI
2009
ACM
16 years 7 months ago
2009
ACM
Although usability is the core aspect of the whole HCI research field, it still waits for its economic breakthrough. There are some corporations that are famous for their usable p...
141
click to vote
INFOCOM
2007
IEEE
16 years 25 days ago
2007
IEEE
— Accurately positioning nodes in wireless and sensor networks is important because the location of sensors is a critical input to many higher-level networking tasks. However, th...
165
click to vote
HICSS
2006
IEEE
16 years 17 days ago
2006
IEEE
The classical (ad hoc) document retrieval problem has been traditionally approached through ranking according to heuristically developed functions (such as tf.idf or bm25) or gene...
150
click to vote
SIGGRAPH
2010
ACM
15 years 10 months ago
2010
ACM
We present a collision detection (CD) method for complex and large-scale fracturing models that have geometric and topological changes. We first propose a novel dual-cone culling...