2686 search results - page 247 / 538 » Testing metric properties |
182
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ICC
2008
IEEE
16 years 1 months ago
2008
IEEE
— This paper investigates minimizing mutual interferences in wireless ad hoc networks by means of topology control. Prior work defines interference as a relationship between link...
154
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DATE
2007
IEEE
16 years 29 days ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
162
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SCAM
2007
IEEE
16 years 27 days ago
2007
IEEE
Collection attributes, as defined by Boyland, can be used as a mechanism for concisely specifying cross-referencelike properties such as callee sets, subclass sets, and sets of v...
223
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STORAGESS
2005
ACM
16 years 5 days ago
2005
ACM
We describe a novel approach for building a secure and fault tolerant data storage service in collaborative work environments, which uses perfect secret sharing schemes to store d...
159
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SIGGRAPH
2000
ACM
15 years 11 months ago
2000
ACM
In this paper we introduce a new light reflection model for image synthesis based on experimental studies of surface gloss perception. To develop the model, we’ve conducted two ...