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RSP
2003
IEEE
117views Control Systems» more  RSP 2003»
16 years 4 days ago
Prototype-Based Tests for Hybrid Reactive Systems
Model-based testing relies on the use of behavior models to automatically generate sequences of inputs and expected outputs. These sequences can be used as test cases to the end o...
Gabor Hahn, Jan Philipps, Alexander Pretschner, Th...
ICSE
2009
IEEE-ACM
15 years 11 months ago
Automating Structural Testing of C Programs: Experience with PathCrawler
Structural testing is widely used in industrial verification processes of critical software. This report presents PathCrawler, a structural test generation tool that may be used ...
Bernard Botella, Mickaël Delahaye, Sté...
VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
15 years 11 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal
DAC
1997
ACM
15 years 11 months ago
ATPG for Heat Dissipation Minimization During Scan Testing
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
Seongmoon Wang, Sandeep K. Gupta
ATS
2001
IEEE
172views Hardware» more  ATS 2001»
15 years 10 months ago
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih...