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VLSID
2005
IEEE
120views VLSI» more  VLSID 2005»
16 years 13 days ago
On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattachar...
WER
2004
Springer
16 years 6 days ago
Structural Testing with Use Cases
Understanding how a user interacts with a system is important if the goal is to deliver a product that meets the user's needs. Use cases constitute a primary source of require...
Adriana Carniello, Mario Jino, Marcos Lordello Cha...
CSMR
2003
IEEE
16 years 5 days ago
Using Observation and Refinement to Improve Distributed Systems Test
Testing a distributed system is difficult. Good testing depends on both skill and understanding the system under test. We have developed a method to observe the system at the CORB...
Johan Moe, David A. Carr, Mikael Patel
193
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COMPSAC
2007
IEEE
15 years 10 months ago
AOP-based automated unit test classification of large benchmarks
Despite the availability of a variety of program analysis tools, evaluation of these tools is difficult, as only few benchmark suites exist. Existing benchmark suites lack the uni...
Cyrille Artho, Zhongwei Chen, Shinichi Honiden
HOTSWUP
2009
ACM
15 years 10 months ago
Efficient Systematic Testing for Dynamically Updatable Software
Recent years have seen significant advances in dynamic software updating (DSU) systems, which allow programs to be patched on the fly. However, a significant challenge remains: Ho...
Christopher M. Hayden, Eric A. Hardisty, Michael W...