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MTDT
2000
IEEE
137views Hardware» more  MTDT 2000»
15 years 11 months ago
Diagnostic Testing of Embedded Memories Based on Output Tracing
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Red...
ECOOP
2000
Springer
15 years 11 months ago
Automated Test Case Generation from Dynamic Models
We have recently shown how use cases can be systematically transformed into UML state charts considering all relevant information from a use case specification, including pre- and ...
Peter Fröhlich, Johannes Link
EVOW
1999
Springer
15 years 11 months ago
Test Pattern Generation Under Low Power Constraints
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Re...
APSEC
2004
IEEE
15 years 10 months ago
Testing Java Interrupts and Timed Waits
Testing concurrent software is difficult due to problems with inherent non-determinism. In previous work, we have presented a method and tool support for the testing of concurrent...
Luke Wildman, Brad Long, Paul A. Strooper
FORTEST
2008
15 years 8 months ago
From MC/DC to RC/DC: Formalization and Analysis of Control-Flow Testing Criteria
This paper describes an approach to the formalization of existing criteria used in computer systems software testing and proposes a new Reinforced Condition/Decision Coverage (RC/D...
Sergiy A. Vilkomir, Jonathan P. Bowen