11718 search results - page 310 / 2344 » Testing database applications |
186
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DATE
2003
IEEE
16 years 1 days ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
144
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ITC
2003
IEEE
16 years 22 hour ago
2003
IEEE
Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...
168
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ITC
2003
IEEE
16 years 22 hour ago
2003
IEEE
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...
151
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EUROCRYPT
2003
Springer
15 years 12 months ago
2003
Springer
Abstract. We study statistical tests with binary output that rarely outputs one, which we call nearly one-sided statistical tests. We provide an efficient reduction establishing im...
185
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DFT
2002
IEEE
15 years 11 months ago
2002
IEEE
Many digital circuits have constraints on the logic values a set of signal lines can have. In this paper, we present two new techniques for detecting the illegal combinations of l...