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DATE
2007
IEEE
84views Hardware» more  DATE 2007»
16 years 1 months ago
On test generation by input cube avoidance
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
Irith Pomeranz, Sudhakar M. Reddy
CCECE
2006
IEEE
16 years 25 days ago
AOP Extension for Security Testing of Programs
The purpose of this paper is to use the aspect-oriented programming (AOP) paradigm for security testing. AOP allows security experts to develop and inject separate modules for con...
Nadia Belblidia, Mourad Debbabi, Aiman Hanna, Zhen...
ETS
2006
IEEE
119views Hardware» more  ETS 2006»
16 years 24 days ago
On-Chip Test Generation Using Linear Subspaces
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
Ramashis Das, Igor L. Markov, John P. Hayes
ICMCS
2006
IEEE
148views Multimedia» more  ICMCS 2006»
16 years 24 days ago
Hierarchical Load Testing Architecture using Large Scale Virtual Clients
In this work, we develop a hierarchical load testing architecture using large scale virtual clients to reduce the testing time and ensure the stability of the server for distribut...
Bum Lim, Jin Kim, Kwang Shim
SEKE
2005
Springer
16 years 7 days ago
A State-Based Approach to Testing Aspect-Oriented Programs
This paper presents a state-based approach to testing aspect-oriented programs. Aspectual state models, as an extension to the testable FREE state model of classes, are exploited ...
Dianxiang Xu, Weifeng Xu, Kendall E. Nygard