11718 search results - page 296 / 2344 » Testing database applications |
187
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ICCAD
1997
IEEE
15 years 11 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
163
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VTS
1997
IEEE
15 years 11 months ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
138
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COMPSAC
2004
IEEE
15 years 10 months ago
2004
IEEE
Temporal correctness is crucial to the dependability of real-time systems. Few methods exist to test for temporal correctness and most existing methods are ad-hoc. A problem with ...
179
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IJCAI
2007
15 years 8 months ago
2007
Testing embedded software systems on the control units of vehicles is a safety-relevant task, and developing the test suites for performing the tests on test benches is time-consu...
188
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ET
2002
15 years 6 months ago
2002
We propose an integrated framework for the design of SOC test solutions, which includes a set of algorithms for early design space exploration as well as extensive optimization for...