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ATS
2005
IEEE
144views Hardware» more  ATS 2005»
16 years 9 days ago
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Bec...
DSVIS
2003
Springer
15 years 12 months ago
Applying Extended Finite State Machines in Software Testing of Interactive Systems
Model Based Testing (MBT) is a functional testing technique that makes use of information from behavioral models of the software to carry out the testing task. This technique has b...
Marcelo Fantinato, Mario Jino
GPCE
2003
Springer
15 years 12 months ago
A Case for Test-Code Generation in Model-Driven Systems
A primary goal of generative programming and model-driven ent is to raise the level of abstraction at which designers and developers interact with the software systems they are bui...
Matthew J. Rutherford, Alexander L. Wolf
DATE
2008
IEEE
123views Hardware» more  DATE 2008»
16 years 1 months ago
Test Strategies for Low Power Devices
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...
C. P. Ravikumar, M. Hirech, X. Wen
VTS
2007
IEEE
103views Hardware» more  VTS 2007»
16 years 28 days ago
At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
Matthieu Tuna, Mounir Benabdenbi, Alain Greiner