11718 search results - page 185 / 2344 » Testing database applications |
145
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
This paper describes an Addressable Shadow Protocol device that is capable of providing connectivity between a backplane resident IEEE 1149.1 test bus master and a plurality of 11...
157
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
183
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PKC
1999
Springer
15 years 10 months ago
1999
Springer
Abstract. Many applications rely on the security of their random number generator. It is therefore essential that such devices be extensively tested for malfunction. The purpose of...
217
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SIGMOD
2012
ACM
13 years 9 months ago
2012
ACM
We present an automatic skew mitigation approach for userdefined MapReduce programs and present SkewTune, a system that implements this approach as a drop-in replacement for an e...
200
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ICC
2007
IEEE
16 years 27 days ago
2007
IEEE
— Recent advances in wireless technology as well as in electronics industry have given rise to the widespread of wireless ad-hoc networking. Expanding data-centric applications t...