6941 search results - page 979 / 1389 » Testing as a Certification Approach |
175
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TODAES
2002
15 years 6 months ago
2002
ct Cross-coupled noise analysis has become a critical concern in today's VLSI designs. Typically, noise analysis makes an assumption that all aggressing nets can simultaneousl...
192
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MJ
2007
15 years 6 months ago
2007
With increasingly smaller feature sizes and higher on-chip densities, the power dissipation of VLSI systems has become a primary concern for designers. This paper first describes...
181
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JBCB
2010
15 years 5 months ago
2010
: Scattering of neutrons and x-rays from molecules in solution offers alternative approaches to the studying of a wide range of macromolecular structures in their solution state w...
184
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SIAMJO
2010
15 years 5 months ago
2010
Abstract. We present a new “lifting” approach for the solution of nonlinear optimization problems (NLPs) that have objective and constraint functions with intermediate variable...
246
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BMCBI
2010
15 years 4 months ago
2010
Background: To exploit the flood of data from advances in high throughput imaging of optically sectioned nuclei, image analysis methods need to correctly detect thousands of nucle...