6941 search results - page 405 / 1389 » Testing as a Certification Approach |
179
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DSD
2006
IEEE
16 years 26 days ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
152
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CSB
2005
IEEE
16 years 12 days ago
2005
IEEE
Raising seeds for biological experiments is prone to error; a careful experimenter will test in the lab to verify that plants are of the intended strain. Choosing a minimal set of...
145
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ICRA
2005
IEEE
16 years 12 days ago
2005
IEEE
— We seek to develop vision-based autonomy for small-scale aircraft known as Micro Air Vehicles (MAVs). Development of such autonomy presents signiÞcant challenges, in no small ...
208
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DATE
2010
IEEE
15 years 12 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
190
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...