6941 search results - page 394 / 1389 » Testing as a Certification Approach |
190
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DFT
1999
IEEE
15 years 11 months ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...
173
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VTS
1995
IEEE
15 years 10 months ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
146
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DKE
2008
15 years 6 months ago
2008
Knowledge validation, as part of knowledge base verification and validation is a critical process in knowledge engineering. The ultimate goal of this process is to make the knowle...
170
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JDWM
2007
15 years 6 months ago
2007
This article presents a new evolutionary algorithm (EA) for induction of mixed decision trees. In nonterminal nodes of a mixed tree, different types of tests can be placed, rangin...
181
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TIT
2011
15 years 1 months ago
2011
—The popular criteria of optimality for quickest change detection procedures are the Lorden criterion, the Pollak criterion, and the Bayesian criterion. In this paper, a robust v...