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ITC
1994
IEEE
90views Hardware» more  ITC 1994»
15 years 10 months ago
Defect Classes - An Overdue Paradigm for CMOS IC
: The IC test industry has struggled .for more than 30years to establish a test approach that would guarantee a low defect level to the customer. Wepropose a comprehensive strategy...
Charles F. Hawkins, Jerry M. Soden, Alan W. Righte...
ECML
2006
Springer
15 years 10 months ago
Transductive Gaussian Process Regression with Automatic Model Selection
Abstract. In contrast to the standard inductive inference setting of predictive machine learning, in real world learning problems often the test instances are already available at ...
Quoc V. Le, Alexander J. Smola, Thomas Gärtne...
VC
2008
117views more  VC 2008»
15 years 6 months ago
Adjacency-based culling for continuous collision detection
We present an efficient approach to reduce the number of elementary tests for continuous collision detection between rigid and deformable models. Our algorithm exploits the connect...
Min Tang, Sung-Eui Yoon, Dinesh Manocha
DSN
2009
IEEE
16 years 1 months ago
Fitness-guided path exploration in dynamic symbolic execution
Dynamic symbolic execution is a structural testing technique that systematically explores feasible paths of the program under test by running the program with different test input...
Tao Xie, Nikolai Tillmann, Jonathan de Halleux, Wo...
AMFG
2005
IEEE
164views Biometrics» more  AMFG 2005»
16 years 11 days ago
Face View Synthesis Across Large Angles
Pose variations, especially large out-of-plane rotations, make face recognition a difficult problem. In this paper, we propose an algorithm that uses a single input image to accura...
Jiang Ni, Henry Schneiderman