6941 search results - page 20 / 1389 » Testing as a Certification Approach |
139
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ICCAD
1994
IEEE
15 years 10 months ago
1994
IEEE
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...
173
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WCE
2007
15 years 7 months ago
2007
— Software testing is a perennial problem, consequently it scores scant attention. An inclusion to testing challenges is aspect-oriented paradigm, which has a dichotomy of core a...
174
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DATE
2006
IEEE
15 years 12 months ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
133
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DATE
2006
IEEE
15 years 12 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
149
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GECCO
2006
Springer
15 years 9 months ago
2006
Springer
Achieving a high quality and cost-effective tests is a major concern for software buyers and sellers. Using tools and integrating techniques to carry out low cost testing are chal...