6941 search results - page 1017 / 1389 » Testing as a Certification Approach |
191
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ICPR
2000
IEEE
16 years 8 months ago
2000
IEEE
In this paper, we propose a new general additive watermarking model based on the content of digital images, called as CBWM (Content-Based Watermarking Model). It provides a common...
200
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DAC
2009
ACM
16 years 7 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
174
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DAC
2000
ACM
16 years 7 months ago
2000
ACM
We revisit a basic element of modern signal integrity analysis, the modeling of worst-case coupling capacitance effects within a switch factor (SF) based methodology. We show that...
207
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
Chemical-mechanical planarization (CMP) and other manufacturing steps in very deep-submicron VLSI have varying effects on device and interconnect features, depending on the local ...
189
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
This paper presents a power grid analyzer based on a random walk technique. A linear-time algorithm is first demonstrated for DC analysis, and is then extended to perform transien...