2302 search results - page 74 / 461 » Testing as Abstraction |
193
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ATS
2005
IEEE
15 years 12 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
137
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ICTIR
2009
Springer
16 years 26 days ago
2009
Springer
Abstract. We have found that the nearest neighbor (NN) test is an insufficient measure of the cluster hypothesis. The NN test is a local measure of the cluster hypothesis. Designer...
150
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RTS
2008
15 years 5 months ago
2008
Abstract The multiprocessor scheduling of collections of real-time jobs is considered. Sufficient tests are derived for feasibility analysis of a collection of sporadic jobs where ...
160
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ASPDAC
2001
ACM
15 years 10 months ago
2001
ACM
Abstract--We present a processor-programmable built-in selftest (BIST) scheme suitable for embedded memory testing in the system-on-a-chip (SOC) environment. The proposed BIST circ...
163
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SIGCOMM
2012
ACM
13 years 8 months ago
2012
ACM
We present a methodology that brings simplicity to large and comt labs by using abstraction. The networking community has appreciated the value of large scale test labs to explore...