4930 search results - page 61 / 986 » Testing a Safety-Critical Application |
162
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VTS
2008
IEEE
16 years 20 days ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
135
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SAC
2009
ACM
16 years 1 months ago
2009
ACM
This paper presents a methodology for interoperability testing based on contextual signatures and passive testing with invariants. The concept of contextual signature offers a fra...
156
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JSA
2000
15 years 6 months ago
2000
As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...
132
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VTS
2007
IEEE
16 years 17 days ago
2007
IEEE
When a test set size is larger than desired, some patterns must be dropped. This paper presents a systematic method to reduce test set size; the method reorders a test set using t...
165
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DATE
2007
IEEE
16 years 19 days ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...