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» Testing a Safety-Critical Application

140

KBSE
1999
IEEE

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Automatic Generation of Test Oracles-From Pilot Studies to Application

15 years 10 months ago

Automatic Generation of Test Oracles-From Pilot Studies to Application

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Martin S. Feather, Benjamin D. Smith

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124

ITC
1998
IEEE

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An almost full-scan BIST solution-higher fault coverage and shorter test application time

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An almost full-scan BIST solution-higher fault coverage and shorter test application time

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Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng

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133

PODS
1996
ACM

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Testing Complex Temporal Relationships Involving Multiple Granularities and Its Application to Data Mining

15 years 10 months ago

Testing Complex Temporal Relationships Involving Multiple Granularities and Its Application to Data Mining

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Claudio Bettini, Xiaoyang Sean Wang, Sushil Jajodi...

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142

ICCAD
1993
IEEE

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Reconfigurable scan chains: a novel approach to reduce test application time

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Reconfigurable scan chains: a novel approach to reduce test application time

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Sridhar Narayanan, Melvin A. Breuer

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139

CRYPTO
1989
Springer

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On the Linear Consistency Test (LCT) in Cryptanalysis with Applications

15 years 10 months ago

On the Linear Consistency Test (LCT) in Cryptanalysis with Applications

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Kencheng Zeng, Chung-Huang Yang, T. R. N. Rao

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