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VTS
2003
IEEE
127views Hardware» more  VTS 2003»
16 years 1 days ago
Bist Reseeding with very few Seeds
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McC...
ERCIMDL
2003
Springer
165views Education» more  ERCIMDL 2003»
15 years 12 months ago
Automatic Multi-label Subject Indexing in a Multilingual Environment
Abstract. This paper presents an approach to automatically subject index fulltext documents with multiple labels based on binary support vector machines (SVM). The aim was to test ...
Boris Lauser, Andreas Hotho
ICVS
2003
Springer
15 years 12 months ago
Automatic Mapping of Settlement Areas Using a Knowledge-Based Image Interpretation System
Abstract. We introduce the knowledge-based image interpretation system GeoAIDA and give examples for an image operator, extracting trees from aerial imagery. Moreover we present a ...
Bernd-Michael Straub, Markus Gerke, Martin Pahl
ITNG
2010
IEEE
15 years 12 months ago
BAUT: A Bayesian Driven Tutoring System
—This paper presents the design of BAUT, a tutoring system that explores statistical approach for providing instant project failure analysis. Driven by a Bayesian Network (BN) in...
Song Tan, Kai Qian, Xiang Fu, Prabir Bhattacharya
152
Voted
ITC
2002
IEEE
81views Hardware» more  ITC 2002»
15 years 11 months ago
Design Rewiring Using ATPG
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
Andreas G. Veneris, Magdy S. Abadir, Mandana Amiri