4930 search results - page 267 / 986 » Testing a Safety-Critical Application |
161
click to vote
ICSE
2008
IEEE-ACM
16 years 6 months ago
2008
IEEE-ACM
An increasing number of cyber attacks are occurring at the application layer when attackers use malicious input. These input validation vulnerabilities can be exploited by (among ...
172
click to vote
DAC
2002
ACM
16 years 7 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
164
click to vote
ICCD
2002
IEEE
16 years 3 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
185
click to vote
DFT
1999
IEEE
15 years 11 months ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...
208
click to vote
SIGMOD
2011
ACM
14 years 9 months ago
2011
ACM
Automatically generating sufficient database states is imperative to reduce human efforts in testing database applications. Complementing the traditional block or branch coverage...