4930 search results - page 206 / 986 » Testing a Safety-Critical Application |
163
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ICCAD
2002
IEEE
15 years 11 months ago
2002
IEEE
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...
154
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ASPDAC
2000
ACM
15 years 10 months ago
2000
ACM
Testing embedded memories is becoming an industry-wide concern with the advent of deep-submicron technology and system-on-chip applications. We present a prototype chip for a progr...
147
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ICCAD
1997
IEEE
15 years 10 months ago
1997
IEEE
A built-in self-test (BIST) methodology to test system backplanes by using BIST functionality in each of its constituent boards is presented. Since the configurations of systems ...
165
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IPPS
2000
IEEE
15 years 11 months ago
2000
IEEE
This paper presents a family of simulators that have been developed for data-intensive applications, and a methodology to select the most efficient one based on a usersupplied req...
155
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FASE
2007
Springer
16 years 21 days ago
2007
Springer
Web applications are increasingly prominent in society, serving a wide variety of user needs. Engineers seeking to enhance, test, and maintain these applications and third-party pr...