4930 search results - page 205 / 986 » Testing a Safety-Critical Application |
154
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DATE
2006
IEEE
16 years 18 days ago
2006
IEEE
Pseudorandom test techniques are widely used for measuring the impulse response (IR) for linear devices and Volterra kernels for nonlinear devices, especially in the acoustics dom...
136
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DATE
2005
IEEE
16 years 5 days ago
2005
IEEE
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI ...
171
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ICCAD
1996
IEEE
15 years 10 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
156
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RTS
2008
15 years 6 months ago
2008
Abstract The multiprocessor scheduling of collections of real-time jobs is considered. Sufficient tests are derived for feasibility analysis of a collection of sporadic jobs where ...
202
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MA
2011
Springer
15 years 1 months ago
2011
Springer
The asymptotic properties of the quasi-maximum likelihood estimator (QMLE) of vector autoregressive moving-average (VARMA) models are derived under the assumption that the errors ...