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ASWEC
2006
IEEE
16 years 16 days ago
Compatibility Test for Coordination Aspects of Software Components
Combining third party software components to customer-individual application systems requires first, standardized specification techniques for describing the technical as well as ...
Johannes Maria Zaha, Antonia Albani
MTV
2005
IEEE
138views Hardware» more  MTV 2005»
16 years 1 days ago
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
Paolo Bernardi, Ernesto Sánchez, Massimilia...
ITC
2003
IEEE
176views Hardware» more  ITC 2003»
15 years 11 months ago
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects
ct This paper describes a general technique to test external memory/caches and memory interconnects using on-chip logic. Such a test methodology is expected to significantly reduc...
Olivier Caty, Ismet Bayraktaroglu, Amitava Majumda...
ISSTA
1993
ACM
15 years 10 months ago
Faults on Its Sleeve: Amplifying Software Reliability Testing
Most of the effort that goes into improving the quality of software paradoxically does not lead to quantitative, measurable quality. Software developers and quality-assurance orga...
Richard G. Hamlet, Jeffrey M. Voas
ATS
2004
IEEE
116views Hardware» more  ATS 2004»
15 years 10 months ago
Testing for Missing-Gate Faults in Reversible Circuits
Logical reversibility occurs in low-power applications and is an essential feature of quantum circuits. Of special interest are reversible circuits constructed from a class of rev...
John P. Hayes, Ilia Polian, Bernd Becker