4930 search results - page 159 / 986 » Testing a Safety-Critical Application |
154
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VLSID
2000
IEEE
15 years 11 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
156
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DAC
1997
ACM
15 years 10 months ago
1997
ACM
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
200
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ATS
2001
IEEE
15 years 10 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
158
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ISTCS
1995
Springer
15 years 10 months ago
1995
Springer
A low-degree test is a collection of simple, local rules for checking the proximity of an arbitrary function to a lowdegree polynomial. Each rule depends on the function’s value...
182
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FORTEST
2008
15 years 8 months ago
2008
Algebraic specifications of data types provide a natural basis for testing data types implementations. In this framework, the conformance relation is based on the satisfaction of a...