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ACST
2006
15 years 7 months ago
A combinatorial group testing method for FPGA fault location
Adaptive fault isolation methods based on discrepancyenabled pairwise comparisons are developed for reconfigurable logic devices. By observing the discrepancy characteristics of m...
Carthik A. Sharma, Ronald F. DeMara
COMPSAC
2009
IEEE
16 years 1 months ago
An Economical Approach to Usability Testing
Many software engineers consider usability testing as one of the more expensive, tedious and least rewarding tests to implement. Making usability testing less expensive and more r...
Carl J. Mueller, Dan E. Tamir, Oleg V. Komogortsev...
ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
15 years 10 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
ENTCS
2008
101views more  ENTCS 2008»
15 years 6 months ago
Improving Fault-based Conformance Testing
Fault-based conformance testing is a conformance testing strategy that relies on specific fault models. Previously, this mutation testing technique has been applied to protocol spe...
Bernhard K. Aichernig, Martin Weiglhofer, Franz Wo...
ICST
2009
IEEE
15 years 4 months ago
Test Redundancy Measurement Based on Coverage Information: Evaluations and Lessons Learned
Measurement and detection of redundancy in test suites attempt to achieve test minimization which in turn can help reduce test maintenance costs, and to also ensure the integrity ...
Negar Koochakzadeh, Vahid Garousi, Frank Maurer