4930 search results - page 128 / 986 » Testing a Safety-Critical Application |
146
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EUROCRYPT
2003
Springer
15 years 11 months ago
2003
Springer
Abstract. We study statistical tests with binary output that rarely outputs one, which we call nearly one-sided statistical tests. We provide an efficient reduction establishing im...
182
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DFT
2002
IEEE
15 years 11 months ago
2002
IEEE
Many digital circuits have constraints on the logic values a set of signal lines can have. In this paper, we present two new techniques for detecting the illegal combinations of l...
163
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MTDT
2000
IEEE
15 years 10 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
227
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ECOOP
2000
Springer
15 years 10 months ago
2000
Springer
We have recently shown how use cases can be systematically transformed into UML state charts considering all relevant information from a use case specification, including pre- and ...
210
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EVOW
1999
Springer
15 years 10 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...