6704 search results - page 190 / 1341 » Testing Scenario-Based Models |
168
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ICCD
2008
IEEE
16 years 3 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
175
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WOSP
2004
ACM
15 years 12 months ago
2004
ACM
Performance characteristics, such as response time, throughput and scalability, are key quality attributes of distributed applications. Current practice, however, rarely applies s...
154
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MA
2010
Springer
15 years 5 months ago
2010
Springer
Quasi-independence is a common assumption for analyzing truncated data. To verify this condition, we consider a class of weighted log-rank type statistics that include existing te...
143
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
178
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SIGSOFT
2008
ACM
16 years 7 months ago
2008
ACM
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...