6704 search results - page 183 / 1341 » Testing Scenario-Based Models |
180
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ICIP
2001
IEEE
16 years 8 months ago
2001
IEEE
Face recognition has become an important topic within the field of pattern recognition and computer vision. In this field a number of different approaches to feature extraction, m...
151
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ICML
2006
IEEE
16 years 7 months ago
2006
IEEE
When constructing a classifier from labeled data, it is important not to assign too much weight to any single input feature, in order to increase the robustness of the classifier....
162
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TACAS
2009
Springer
16 years 1 months ago
2009
Springer
We describe the design and implementation of an automatic invariant generator for imperative programs. While automatic invariant generation through constraint solving has been exte...
196
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VTS
2008
IEEE
16 years 27 days ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
191
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RSP
2007
IEEE
16 years 24 days ago
2007
IEEE
This paper addresses the need for formal specification and runtime verification of system-level requirements of distributed reactive systems. It describes a formalism for specifyi...