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GRID
2004
Springer
15 years 12 months ago
DiPerF: An Automated DIstributed PERformance Testing Framework
We present DiPerF, a distributed performance-testing framework, aimed at simplifying and automating service performance evaluation. DiPerF coordinates a pool of machines that test...
Catalin Dumitrescu, Ioan Raicu, Matei Ripeanu, Ian...
ICECCS
2002
IEEE
91views Hardware» more  ICECCS 2002»
15 years 11 months ago
Mars Polar Lander Fault Identification Using Model-based Testing
This paper describes the application of the Test Automation Framework on the Mars Polar Lander (MPL) software. The premature shutdown of the descent engine on the MPL spacecraft i...
Mark R. Blackburn, Robert Busser, Aaron Nauman, Ro...
VTS
2000
IEEE
167views Hardware» more  VTS 2000»
15 years 11 months ago
Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukher...
CONCUR
2006
Springer
15 years 10 months ago
Minimization, Learning, and Conformance Testing of Boolean Programs
Boolean programs with recursion are convenient abstractions of sequential imperative programs, and can be represented as recursive state machines (RSMs) or pushdown automata. Motiv...
Viraj Kumar, P. Madhusudan, Mahesh Viswanathan
ET
2007
119views more  ET 2007»
15 years 6 months ago
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...