6704 search results - page 176 / 1341 » Testing Scenario-Based Models |
166
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ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
157
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LATA
2009
Springer
16 years 1 months ago
2009
Springer
We show that fixed membership testing for many interesting subclasses of multi-pushdown machines is no harder than for pushdowns with single stack. The models we consider are MVPA...
168
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ICSEA
2009
IEEE
16 years 1 months ago
2009
IEEE
—In this paper, it is shown that synthetic images can be used to test specific use cases of a lane tracking algorithm which has been developed by Audi AG. This was achieved by s...
178
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KBSE
2008
IEEE
16 years 27 days ago
2008
IEEE
We present a novel approach for black-box testing of database management systems (DBMS) using the Alloy tool-set. Given a database schema and an SQL query as inputs, our approach ...
200
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ISSTA
2006
ACM
16 years 14 days ago
2006
ACM
We present initial work on perturbation techniques that cause the manifestation of timing-related bugs in distributed memory Message Passing Interface (MPI)-based applications. Th...