6704 search results - page 168 / 1341 » Testing Scenario-Based Models |
170
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ETS
2006
IEEE
16 years 17 days ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
189
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ICCAD
1995
IEEE
15 years 10 months ago
1995
IEEE
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...
161
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ERLANG
2008
ACM
15 years 8 months ago
2008
ACM
When creating software, data types are the basic bricks. Most of the time a programmer will use data types defined in library modules, therefore being tested by many users over ma...
190
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SAC
2008
ACM
15 years 6 months ago
2008
ACM
In this paper we investigate and propose a fully automated technique to perform conformance checking of Java implementations against UML class diagrams. In our approach, we reused...
228
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GLVLSI
2009
IEEE
15 years 4 months ago
2009
IEEE
To assist in dynamic assertion-based verification, we present a method to automatically build a test vector generator from a temporal property. Based on the duality between monito...