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FTCS
1993
94views more  FTCS 1993»
15 years 7 months ago
Balance Testing of Logic Circuits
We present a new test response compression method called cumulative balance testing (CBT)that extends both balance testing and accumulatorcompression testing. CBT uses an accumulat...
Krishnendu Chakrabarty, John P. Hayes
ICST
2010
IEEE
15 years 5 months ago
Towards a Testing Methodology for Reactive Systems: A Case Study of a Landing Gear Controller
—In this case study we test a landing gear control system of a military aircraft with the new version of LUTESS, a tool for testing automatically synchronous software. LUTESS req...
Laya Madani, Virginia Papailiopoulou, Ioannis Pari...
STTT
2011
161views more  STTT 2011»
15 years 1 months ago
Automating regression testing using web-based application similarities
Web-based applications are one of the most widely used types of software, and have become the backbone of many e-commerce and communications businesses. These applications are ofte...
Kinga Dobolyi, Elizabeth Soechting, Westley Weimer
VLSID
2004
IEEE
139views VLSI» more  VLSID 2004»
16 years 6 months ago
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
André Ivanov, Baosheng Wang, Josh Yang
KBSE
2008
IEEE
16 years 27 days ago
Random Test Run Length and Effectiveness
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
James H. Andrews, Alex Groce, Melissa Weston, Ru-G...