6704 search results - page 159 / 1341 » Testing Scenario-Based Models |
137
click to vote
DFT
2005
IEEE
16 years 2 days ago
2005
IEEE
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...
197
click to vote
KBSE
2005
IEEE
16 years 1 days ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
171
click to vote
COMBINATORICA
2008
15 years 6 months ago
2008
Consider the following seemingly rhetorical question: Is it crucial for a property-tester to know the error parameter in advance? Previous papers dealing with various testing prob...
178
click to vote
ACSAC
2010
IEEE
15 years 4 months ago
2010
IEEE
- The advanced metering infrastructure (AMI) is revolutionizing electrical grids. Intelligent AMI "smart meters" report real time usage data that enables efficient energy...
168
click to vote
KDD
2006
ACM
16 years 6 months ago
2006
ACM
Outlier detection can uncover malicious behavior in fields like intrusion detection and fraud analysis. Although there has been a significant amount of work in outlier detection, ...