6704 search results - page 150 / 1341 » Testing Scenario-Based Models |
161
click to vote
ISMVL
2005
IEEE
16 years 18 hour ago
2005
IEEE
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
154
click to vote
ISCAS
2003
IEEE
15 years 11 months ago
2003
IEEE
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
144
click to vote
ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...
149
click to vote
ASPDAC
2005
ACM
15 years 8 months ago
2005
ACM
－ We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and cr...
150
click to vote
FORTE
1998
15 years 7 months ago
1998
Abstract: We present a new algorithm for automatic test generation for multicast routing. Our algorithm processes a nite state machine (FSM) model of the protocol and uses a mix of...