6704 search results - page 148 / 1341 » Testing Scenario-Based Models |
161
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...
182
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DELTA
2002
IEEE
15 years 11 months ago
2002
IEEE
: The way address sequences and data patterns appear on the outside of a memory may differ from their internal appearance; this effect is referred to as scrambling, which has a lar...
146
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DATE
2000
IEEE
15 years 11 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
164
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COMPSAC
1999
IEEE
15 years 10 months ago
1999
IEEE
In this paper, we study the optimal software release problem considering cost, reliability and testing eficiency. We first propose a generalized logistic testing-effort function t...
164
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MA
2010
Springer
15 years 4 months ago
2010
Springer
A general approach for developing distribution free tests for general linear models based on simplicial depth is applied to multiple regression. The tests are based on the asympto...