6704 search results - page 147 / 1341 » Testing Scenario-Based Models |
160
click to vote
VTS
1997
IEEE
15 years 10 months ago
1997
IEEE
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
194
click to vote
ASE
2006
15 years 6 months ago
2006
Finite state machines have been used to model a number of classes of system and there has thus been much interest in the automatic generation of test sequences from finite state m...
153
click to vote
ENTCS
2006
15 years 6 months ago
2006
The article introduces an extension of the well-known conformance relation ioco on labeled transition systems (LTS) with refused inputs and forbidden actions. This extension helps...
162
click to vote
VLSID
2005
IEEE
16 years 6 hour ago
2005
IEEE
Microfluidics-based biochips offer a promising platform for massively parallel DNA analysis, automated drug discovery, and real-time biomolecular recognition. The first part of th...
150
click to vote
ISQED
2003
IEEE
15 years 11 months ago
2003
IEEE
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...