6704 search results - page 146 / 1341 » Testing Scenario-Based Models |
145
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ICCAD
1998
IEEE
15 years 10 months ago
1998
IEEE
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
128
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ATS
1997
IEEE
15 years 10 months ago
1997
IEEE
This paper considers two types of n-bit adders, ripple carry adders and cascaded carry look-ahead adders, with minimum tests for stuck-at fault models. In the first part, we prese...
170
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APSEC
2004
IEEE
15 years 10 months ago
2004
IEEE
Domain testing, a technique for testing software or portions of software dominated by numerical processing, is intended to detect domain errors that usually arise from incorrect i...
168
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DATE
2004
IEEE
15 years 10 months ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
153
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WSE
2003
IEEE
15 years 11 months ago
2003
IEEE
As web applications evolves, their structure may become more and more complex. Thus, systematic approaches/methods for web application testing are needed. Existing methods take in...