6704 search results - page 142 / 1341 » Testing Scenario-Based Models |
168
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ETS
2006
IEEE
16 years 14 days ago
2006
IEEE
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
128
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ISSTA
2006
ACM
16 years 11 days ago
2006
ACM
This paper extends basic software-testing theory to software components and adds explicit state to the theory. The resulting theory e enough to abstractly model the construction o...
152
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ATS
2003
IEEE
15 years 11 months ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
143
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ICSE
1997
IEEE-ACM
15 years 10 months ago
1997
IEEE-ACM
Testing methods are compared in a model where program failures are detected and the software changed to eliminate them. The question considered is whether it is better to use test...
166
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ISCAS
1999
IEEE
15 years 10 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...